Trooper-V Wafer-Level AOI Handler

Trooper-V is Pentamaster’s next level high speed AOI handler designed for wafer-level packages. In just 2 minutes, Trooper-V inspection system is able to inspect an entire wafer consisting of approximately 70,000 dies. With high quality objective lens, it allows for different levels of magnification to accommodate various types & sizes of dies.
It is available in 2 different designs depending on our customer’s requirements, one which allows it to operate in cleanrooms (Class level 10) and the other which is operate-able in standard production floors.

Advanced Microscope with both Bright & Dark Field Capability
High Quality Objective Lens (2.0x, 5.0x, 7.5x magnification)
Light Source Illumination with RGB Configuration
Short-Wave Infrared (SWIR) Imaging Technology for SiC
Customizable Wafer Map Generation
Equipped with Bernoulli Dual Arm Raw Wafer Robot
Integrate-able with multiple wafer size handling

Product Specification

Input/ Output Options	Raw Wafer (6”, 8”, 12”) Mylar Wafer Ring (6”, 8”, 12”)
Selection of Packages	Die, Silicon Carbide (SiC), CMOS Image Sensor, Flip Chip
Wafer Per Hour	± 30 Wafers
Vision Capabilities	Pre-Wafer Alignment (x, y and θ orientation) Die Surface Inspection (Scratch, Crack, Chipping, Metal Peeling, Misaligned Cut, Foreign Material, Missing Die, Edge Bur, Edge Debris, Optical Character Recognition, Polyimide Peeling, Discoloration and Contamination) Probe Mark Inspection (Size, Area and Position) Wafer Saw Line Inspection Final Verification
Camera Technology	Short-Wave Infrared (SWIR) Imaging Technology Lens Magnification Capabilities (2.0x, 5.0x, 7.5x magnification) Illumination (Light Source with RGB configuration)