
It is designed to perform burn-in test onto certain type of LED products in tile form by placing them under high humidity, high temperature and high current to test the LEDs reliability & performance. It is a user-friendly solution with built in precision DMM for product monitoring and data acquisition capabilities.
Channel Number | >600 per wafer unit |
Burn-in Duration | Programmable |
Electrical Parameter Measurements |
Current Source Range • 100mA~3,000mA Current Measurement Tolerance • 2mA or ±1% Compliance Voltage • 24VDC Voltage Source Range • 5~24VDC Voltage Source Accuracy • 20mV or ±1% |
Programmable Temperature Control |
Temperature Measuring Control • Ambient~130°C Temperature Setting Range • 45°C~130°C Temperature Setting Resolution • 0.1°C Operation Temperature • 20°C~30°C Operation Humidity • <85% RH, Non-Condensing |
Additional Features | • Chiller (optional) • Real time display of go-no-go Vf & If measurements • During system power up sources are disabled • Anode & cathode pads of the substrate are electrically isolated • Open or close circuit of DUT is detectable during burn-in • Easy load and unloading of ceramic substrate tile • Remote accessibility via LAN network connection • Golden Unit Monitoring |