Trooper-BI Wafer-Level VCSEL/LED/Micro LED Burn-in Test System

Trooper-BI Wafer-Level VCSEL/LED/Micro LED Burn-in Test System

It is a full turnkey solution to probe & burn-in VCSEL/ LED substrate in wafer-level. The tester is capable of testing up to 7,200 DUTs at one go with a controlled temperature up to 135°C. It comes with intelligent features such as built-in water cooling system, leakage detection system and temperature monitoring system.

Standard Features

  • Fully Motorized Mechanism
  • Self-Alignment Precision Probing
  • Easy Load & Unloading of Substrate Tiles
  • Programmable Temperature Profile
  • Modular DI Water Cooling System for Easy Maintenance
  • User-Defined Burn-in Profile (Continuous/ Pulse Mode)
  • Designed for Light Detection and Range (LIDAR) Applications

Optional Features

  • Remote Accessibility Engineering Data Base
  • Pogo Pins Cleaning Capability
  • Pogo Pins Life Span Monitoring
Product Specification
Channel Number Up to 7,200 units
Burn-in Duration Programmable
Probing Pogo Pin Accuracy ±50μm
Electrical Parameters Measurements Current Source Range: 20mA~100mA/ 0.2A~1.5A
Current Measurement Tolerance: 0.2mA~± 1%
Compliance Voltage: 24V DC
Voltage Source Range: 5~24V DC
Voltage Source Accuracy: 20mV or ± 1%
Programmable Temperature Control Temperature Measuring Control: Ambient~130°C
Temperature Setting Range: 45°C~130°C
Temperature Setting Resolution: 0.1°C
Operation Temperature: 20°C~30°C
Operation Humidity: <85%RH, Non-Condensing