LED Test & Burn-in Test System

LED Test & Burn-in Test System

It is designed to perform burn-in test on certain LED products in wafer form by placing them under high humidity, high temperature and high current to test the LEDs reliability & performance. It is a user-friendly solution with built-in precision DMM for product monitoring and data acquisition capabilities.

  • High Speed
  • Programmable Constant Drivers
  • Open/ Short Test Monitoring
  • Individual Constant Current Driver for LED
  • Customized Test Handler, Test Socket and Wafer Burn-in Tray for Probing LED.
 
General Specifications
Channel Number >4000 per wafer unit
Burn-in Duration Programmable
Electrical Parameter Measurements Current Source Range
• 20mA~100mA / 0.2A~1.5A
Current Measurement Tolerance
• 0.2mA or ±1%
Compliance Voltage
• 24V DC
Voltage Source Range
• 5~24V DC
Voltage Source Accuracy
• 20mV or ±1%
Programmable Temperature Control Temperature Measuring Range
• Ambient~130°C
Temperature Setting Range
• 45°C~130°C
Temperature Setting Resolution
• 0.1°C
Operation Setting Resolution
• 0.1°C
Operation Temperature
• 20°C~30°C
Operation Humidity
• <85% RH, Non-Condensing
Additional Features • Vision Inspection Capability
• Pass/ Reject status indication in wafer map
• Current (IF) & Voltage (VF) monitoring for individual unit
• Probe Cleaning
• Golden Unit Monitoring
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