Trooper-BI2 Wafer-Level Power Device Burn-in Test Handler

Trooper-BI2 Wafer-Level Power Device Burn-in Test Handler

It is the latest wafer-level burn-in test system designed for power devices. This innovative tester accommodates 2 wafer test parallelism, 720 die test parallelism per wafer. Independent driver channels for simultaneous voltage/current measurement as well as temperature monitoring. Designed with a seal chamber to accommodate inert gas such as nitrogen and arc suppression gasses, it protects the DUTs from arc & oxidation while keeping the tester in an operational temperature state without overheating.

  • Incorporated with fully automated handlers
  • All in one solution with built-in test chambers
  • High-Level User Defined Burn-in Profile (Continuous or Pulse Mode)
  • Integrated with Nitrogen Gas Cooling System
  • Easy Load & Unloading of Substrate Tiles
  • Programmable Temperature Profile
Product Specification
Input/ Output Option Wafer
Channel Number Up to 720 units
Burn-in Duration Programmable
Electrical Parameters Measurements

Current Source Range:

  • 2uA, 500uA, 5mA

Current Measurement Tolerance:

  • 1% accuracy. 5nA, 0.5uA, 1uA for respective current range

Voltage Source Range:

  • High Voltage source: 0~3KV
  • Low Voltage source: +/-50V

Voltage Source Accuracy:

  • High Voltage: ±1%
  • Low Voltage: 20mV or 0.1%
Programmable Temperature Control

Temperature Measuring Control:

  • Ambient~175°C

Temperature Setting Range:

  • Up to 175°C

Temperature Setting Resolution:

  • 0.1°C

Operating Temperature:

  • Up to 175°C

Operating Humidity:

  • <65% RH @ 23°C (ambient)