It is the latest wafer-level burn-in test system designed for power devices. This innovative tester accommodates 2 wafer test parallelism, 720 die test parallelism per wafer. Independent driver channels for simultaneous voltage/current measurement as well as temperature monitoring. Designed with a seal chamber to accommodate inert gas such as nitrogen and arc suppression gasses, it protects the DUTs from arc & oxidation while keeping the tester in an operational temperature state without overheating.
Input/ Output Option | Wafer |
Channel Number | Up to 720 units |
Burn-in Duration | Programmable |
Electrical Parameters Measurements |
Current Source Range:
Current Measurement Tolerance:
Voltage Source Range:
Voltage Source Accuracy:
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Programmable Temperature Control |
Temperature Measuring Control:
Temperature Setting Range:
Temperature Setting Resolution:
Operating Temperature:
Operating Humidity:
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