Trooper-BI4 Wafer-Level Power Device Burn-in & Test Handler

Trooper-BI4 Wafer-Level Power Device Burn-in & Test Handler

Trooper-BI4 is a fully automated burn-in test handler which offers excellent performance for silicon carbide wafer reliability & burn-in testing in wafer-level. It allows 4 wafers to be burn-in at the same time with our precision active alignment gantry system to automate the handling of wafers from cassettes to the chucks. The handler can support wafer from 2” up to 12” and offers multiple probe tests reaching up to 1800 test channels per wafer with thermal chucks temperature that goes up to 200°C. 

  • Channel Number: Up to 1800 per wafer unit 
  • Supports 2”, 3”, 4”, 5”, 6”and 8” bare wafers
  • Multiple probe tests at elevated temperatures of up to 200°C using thermal chucks
  • One probe card to handle a wide range of test parameters, ensuring its
    efficiency and cost-effectiveness
  • User Definable Burn-in Profile 
  • Performs both pre-burn-in and post burn-in tests
  • Post burn-in visual inspection
  • Real Time Voltage/Current Measurement and Temperature Monitoring during burn-in
Product Specification
Input/ Output OptionWafer Cassette Handling
Channel NumberUp to 1800 per wafer unit (Subject to evaluation for higher channels)
Wafer Size2, 3, 4, 5, 6, 8”
Wafer Throughput Per 24 Hours38 wafers (based on 1800 die wafers and 2-hour burn-in per session)
Burn-in DurationProgrammable
Test CapabilitiesPre/Post Test (IGSS, IDSS, Vth, VSD)
Stress Test (IGSS, IDSS)