Trooper-BI1 Wafer-Level Power Device Burn-in & Test Handler

Trooper-BI is a high-performance burn-in test handler specifically designed for wafer-level silicon carbide (SiC) power devices. The handler is equipped with vacuum-based wafer robot end effect that can handle bare wafers between 2” and 8” based on your requirements. It offers excellent multiple probe tests ranging from 720 to 1800 test channels, while ensuring precision thermal chucks support temperatures up to 200°C. By conducting high voltage/current stress tests under extreme temperatures, Trooper-BI effectively identifies and eliminates defects at an early stage, ensuring the delivery of fully tested and reliable devices.

• Channel Number: Up to 1800 per wafer unit 
• Supports 2”, 3”, 4”, 5”, 6”and 8” bare wafers
• Multiple test parallelism with precision thermal chuck up to 200°C
• One probe card to handle a wide range of test parameters, ensuring its
  efficiency and cost-effectiveness 
• User Definable Burn-in Profile 
• Performs both pre-burn-in and post burn-in test
• Post burn-in visual inspection
• Real Time Voltage/Current Measurement and Temperature Monitoring during burn-in

Product Specification