High Power/Voltage Wafer-Level Burn-in Test Solution for Silicon Carbide (SiC)

High Power/Voltage Wafer-Level Burn-in Test Solution for Silicon Carbide (SiC)

Penang, Malaysia (December 2021) – Pentamaster, a one stop solution provider for innovative and advanced test solutions is pleased to introduce WLBI-22, our latest SiC wafer burn-in tester that is designed to ensure a safer and brighter future for electrical vehicle consumers.

Silicon carbide (SiC) power semiconductors are currently in high demands for a variety of applications, particularly in the automotive sector due to the rise of Electrical Vehicles (EVs). SiC have emerged as the preferred technology for battery electric vehicle power conversion in on-board & off-board electric vehicle battery chargers and the electric power conversion as well as control of the electric engines. This is compounded by the fact that the adaptation of SiC has enabled engineers to achieve higher voltage and power demands in a much cost-effective way.

To meet the growing demands while achieving zero-defect standards with high yield and reliability rate places a huge challenge on manufacturers, as silicon carbide is known to have high infant mortality rates. Nevertheless, with Pentamaster’s proprietary wafer-level testing know-hows and experience, we are able to intercept and minimize the defect density to the most minute while increasing both yields & reliability rates.

WLBI Wafer-Level Burn-in Tester for Power Devices (SiC)

WLBI-22 accommodates up to 2 wafers test parallelism, 480 die test parallelism per wafer with independent driver channels for simultaneous voltage/current measurement as well as temperature monitoring. It comes with a seal chamber to accommodate inert gasses such as nitrogen and arc suppression gasses which protects our customer’s DUTs from arc & oxidation while also keeping the tester in an operational temperature state without overheating.

With Pentamaster’s WLBI-22 reliability burn-in test solution for silicon carbide, it detects and phases out potential early life failures at an early stage to not only save costs but also to provide the automotive industries with extremely reliable devices for their safety-critical applications.

Contact us today to know more.