Mason is a high speed pick & place handler designed for high volume multi-site IC and image sensor testing. It simulates real-life environment conditions to test the performance and reliability of the DUTs under ambient and hot temperature ranging from 25°C to 175°C. It is also capable of testing a wide spectrum of packages supporting single, dual, quad and octa test sites.
Input / Output Option | JEDEC Tray |
Selection of Packages | QFP, BGA, QFN, MLF, TSSOP, SOIC, SIP, ODFN, OLGA |
Sprint UPH | Up to 9,000 (based on 3x3mm device with 4x pick-up arms) Up to 13,500 (based on 3x3mm device with 16x pick-up arms) |
Test Capabilities | Electrical Functional Test CMOS Image Sensor Test Ambient/Hot Temperature test (ranging from 25°C to 175°C) |
Test Sites | Up to 16 sites |
Test Contact Method | Punch Type |
Test Mounting | Direct Docking |