Mason Pick & Place Test Handler

Mason Pick & Place Test Handler

Mason is a high speed pick & place handler designed for high volume multi-site IC and image sensor testing. It simulates real-life environment conditions to test the performance and reliability of the DUTs under ambient and hot temperature ranging from 25°C to 175°C. It is also capable of testing a wide spectrum of packages supporting single, dual, quad and octa test sites.

  • Up to 16 test sites
  • Active thermal control
  • Direct docking to test head
  • Capable of testing a wide spectrum of packages
  • Ambient/Hot Temperature test (ranging from 25°C to 175°C)
Product Specification
Input / Output Option JEDEC Tray
Selection of Packages QFP, BGA, QFN, MLF, TSSOP, SOIC, SIP, ODFN, OLGA
Sprint UPH Up to 9,000 (based on 3x3mm device with 4x pick-up arms)
Up to 13,500 (based on 3x3mm device with 16x pick-up arms)
Test Capabilities Electrical Functional Test
CMOS Image Sensor Test
Ambient/Hot Temperature test (ranging from 25°C to 175°C)
Test Sites Up to 16 sites
Test Contact Method Punch Type
Test Mounting Direct Docking