Die-Level Test
PM52X-KGD Die-Level Test Handler
It is designed for high volume single or multi-site bare die testing, supporting various types of bare dies for multiple applications.
| Waffle Pack, Wafer Ring, De-Taper | |
| Waffle Tray, Wafer Reconstruction, Tape & Reel | |
| Die | |
| AC Test, DC Test, UIS Test at ambient to hot temperature | |
|
Top Inspection: Surface Cosmetic, DUT Dimension, 2D Lead Bottom Inspection: Surface Cosmetic, Pad Dimension, Pad Cosmetic Probe Positioning In-Pocket Inspection: Device Presence/Absence, Device Orientation |