Module-Level Power Device Burn-in Test Handler

Module-Level Power Device Burn-in Test Handler

It is the latest module-level burn-in test system designed for power devices. This innovative tester accommodates 720 power module test parallelism under modules tray-to-tray forms, consisting of independent driver channels for simultaneous voltage/current measurement as well as temperature monitoring. The Burn-in test handler is designed with seal chamber to accommodate nitrogen. It protects the DUTs oxidation while keeping the tester in an operational temperature state without overheating.

  • Incorporated with fully automated handlers
  • All in one solution with built-in test chambers
  • High-Level User Defined Burn-in Profile (Continuous or Pulse Mode)
  • Integrated with Nitrogen Gas Cooling System
  • Easy Load & Unloading of Substrate Tiles
  • Programmable Temperature Profile
Product Specification
Input/ Output Option JEDEC Tray
Channel Number Up to 2040 units
Burn-in Duration Programmable
Electrical Parameters Measurements Leakage Current Measurement: 600V~3000V DC Drain Voltage
Test Parameters: Vth, IGSS, IDSS, VDSon
Leakage Current Measurement Accuracy: 1%
Programmable Temperature Control Temperature Rise Time: 4 minutes (based on room temp to 150°C)
Temperature Tolerance: +/- 5°C
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