A high speed turret test & vision handler designed for Discrete & ICs testing. It performs vision inspection and electrical functional test along with optional features such as laser marking, sorting, de-taping and taping depending on requirements. The handler also offers a wide selection of packages and a variety of options for both input & output configurations.
Input Options | Vibrator Bowl, Plastic Tube Stacker, De-Taper, JEDEC Tray |
Output Options | Tape & Reel, Plastic Tube Stacker, JEDEC Tray |
Package Type | TO, DPAK, PDIP, SOIC, TSSOP, SOT, QFN |
Sprint UPH | >40,000 (depending on package & machine configuration) |
Vision Capabilities | Lead, Mark, Package, Pad Inspection |
Test Capabilities | Electrical Test Functional Test Open Short Test |
Test Sites | Up to 8 parallel test sites |
Test Contact Method | Flat Test/ Clamp Test/ Socket Test Solution |
Test Socket Options | Kelvin/ Non-Kelvin |
Individual Press (IP) Force Control | Up to 10N independent Z axis Up to 50N independent Z axis (optional) Up to 80N with Pneumatic Solution (optional) |