Wafer-Level Test
Trooper-T
Wafer-Level VCSEL Test Handler
It is designed to measure & test the optical power efficiency & wavelength of the VCSEL's projected beam while analyzing both near & far field tests to determine the emitting diameter, mode emission characteristics as well as the maximum emission angle.
| Wafer Cassette | |
| VCSEL, LED, Micro LED | |
| LIV Sweep Test, Far Field Test, Near Field Test | |
| Automated yield monitoring, Automated retest, Automated GR&R <10%, Wafer mapping, Partial wafer testing |
Queen-QCP
Edge-Emitting Laser Test Handler
It is a fully automated test & qualify system for full LIV sweep test as well as spectral and far-field beam characterization of edge-emitting lasers (EEL).
| Wafer | |
| Edge Emitting Laser | |
| LIV Sweep Test, Laser Far Field Test | |
| Dimension Inspection | |
| Tray map file integration, Automated optical inspection, Automated yield monitoring, Automated GR&R <10% |
Queen-QCD
MLA & DOE Test Handler
An innovative test handler for optical lens such as Diffractive Optical Elements (DOE) and Micro Lens Array (MLA) featuring high speed far field test, high
accuracy AOI system and soft handling capabilities to eliminate any damage to DUT.
| Wafer Ring | |
| JEDEC Tray, Wafer Ring | |
| Diffractive Optical Elements [DOE], Micro Lens Array [MLA] | |
| Optical Transmission Efficiency, Far Field Test | |
| Vision Alignment, Dimension Inspection, Cosmetic Inspection | |
| Tray map file integration, Automated optical inspection, Automated yield monitoring, Automated GR&R <10% |