Wafer/Module-Level Burn-in
VCSEL
Full turnkey burn-in test & probing solution for VCSEL at wafer-level.
Trooper-BI
Wafer-Level VCSEL Burn-in Handler
Full turnkey burn-in test & probing solution for wafer-level VCSEL, capable of testing up to 1,500 DUTs in one pass with a controlled temperature up to 190°C.
| VCSEL, LED | |
| Up to 1,500 per wafer unit | |
| Programmable | |
| ±50μm | |
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Current Source Range: ±20mA~1,500mA Current Measurement Tolerance: 0.2mA or ±1% Compliance Voltage: 24V DC Voltage Source Range: 5~24V DC Voltage Source Accuracy: 20mV or ±1% |
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Temperature Measuring Control: Ambient~190°C Temperature Setting Range: 25°C~250°C Temperature Setting Resolution: 0.1°C~0.5°C Operation Temperature: 20°C~30°COperation Humidity: <85%RH, Non-Condensing |
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| Vision Inspection Capability on wafer unit's surfaces Pass/Reject statuses indicated in tile Current (If) and Voltage (Vf) monitoring for individual unit Golden unit monitoring |
LED
Performs burn-in test on wafer-level LEDs under high humidity, temperature and current.
LED Burn-in Handler
A fully customizable burn-in test handler for LED featuring programmable constant drivers and individual constantly current driver as well as open short test monitoring.
| LED | |
| Up to 4,000 per wafer unit | |
| Programmable | |
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Current Source Range: ±20mA~100mA Current Measurement Tolerance: 0.2mA or ±1% Compliance Voltage: 24V DC Voltage Source Range: 5~24V DC Voltage Source Accuracy: 20mV or ±1% |
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Temperature Measuring Control: Ambient~130°C Temperature Setting Range: 45°C~130°C Temperature Setting Resolution: 0.1°C Operation Temperature: 20°C~30°C Operation Humidity: <85%RH, Non-Condensing |
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| Vision Inspection Capability on wafer unit's surfaces Pass/Reject statuses indicated in tile Current (If) and Voltage (Vf) monitoring for individual unit Probe cleaning Golden unit monitoring |