32-position turret platform for testing, inspection, laser marking and sorting.

PM31-T/PM35-T/PM38-T

Turret Test & Vision Handler
A high-speed turret platform designed for discrete & ICs testing and vision inspection along with optional features such as laser marking, sorting, de-taping and taping depending on your requirements.

Vibrator Bowl, Plastic Tube Stacker, De-Taper, JEDEC Tray
Tape & Reel, Plastic Tube Stacker, JEDEC Tray
Leadless Packages: Discrete DFN, QFN
Leaded Packages: Leaded SOIC, MSOP, TSSOP, TO252, TO263, SOT223, SC70, SOT, SOD, SC79
Mark, Lead, Package, In-Pocket, 5-Sided Inspection
Electrical Functional Test, Microphone Acoustic Test, Humidity Sensor Test, Optical Sensor Test
Up to 8 parallel test sites
Up to 10N independent Z axis
Up to 50N independent Z axis (optional)
Up to 80N with Pneumatic Solution (optional)

A complete turnkey solution with comprehensive features for a wide array of packages.

PM38

Wafer-Level Die Sorter
A complete turnkey solution with comprehensive features from wafer input, electrical functional test, stimulus test, 6-sided inspection, sorting to tape & reel for a wide array of packages.

Mylar Wafer Ring [8”, 10”, 12”], De-Taper [optional]
Tape & Reel [with auto reel changer], JEDEC Tray
Semiconductors [Leadless Packages: Discrete DFN, QFN]
[Leaded Packages: Leaded SOIC, MSOP, TSSOP, TO252, TO263, SOT223, SC70, SOT, SOD, SC79] LEDs
MEMS Microphone [Top port/Bottom port]
Optical Sensors [Structured Light 3D Sensor, Time of Flight 3D Sensor, Proximity Sensor, Ambient Light Sensor, Spectrum Sensor, 3D Magnetic Sensor]
Top Vision Inspection, 2D Pad Measurement, 3D Measurement, Post Seal Inspection, Active Die Inspection, In-Pocket Inspection
Electrical Functional Test, Stimulus Test [Sensitivity Test], Signal to Noise Ratio (SNR) Test, LED Wavelength & Radiant Test, Photo Diode Sensitivity Test, Light Current Voltage (LIV) Slope Test, Cross Talk & Measurement Test, Magnetic Test]
Up to 8 sites