Trooper-V: Wafer AOI Solution which eliminates reliance on human handling while optimizing productivity and yield.

Penang, Malaysia (September 2021) – Pentamaster, a one stop solution provider for advanced AOI solutions is proud to introduce our latest automated wafer inspection solution- Trooper-V that is designed to help semiconductor manufacturers enhance their product’s quality consistency as well as maximizing productivity efficiency and yield.

As we all know, metrology and inspection are crucial for the semiconductor manufacturing process. They are established at crucial points of the semiconductor manufacturing processes to ensure that a certain yield can be obtained and maintained.

Gone are the days where manufacturers would rely on workers to manually perform cosmetic inspections as it’s proven to be less reliable and prone to human errors. The rise in the complexity of design for wafers and shrinkage of products are also making wafer inspections even more challenging and costlier at each node. Hence, these manufacturers are constantly searching for advanced automated inspection systems that is able to ensure premium quality products are produced while phasing out the defected ones. What makes it even more challenging is that various manufacturers have different types and sizes of wafers/products which demands for high customizability features as well. Upon seeing such a huge demand in the market, Pentamaster designed our own wafer AOI handler- Trooper-V which offers a wide spectrum of inspection capabilities that can be customized for different needs & requirements.

Trooper-V Wafer-AOI Handler

Trooper-V is one of Pentamaster’s latest and advanced wafer inspection solution which is designed for 2D surface defect inspections and metrology.

With high-speed camera and inspection algorithms, it can inspect an entire wafer which consists approximately 70,000 dies under 2 minutes. To accommodate various types and sizes of dies, it uses an advanced microscope with objective lens, allowing for different levels of magnification. It features multiple handling mechanisms which supports both raw wafer and mylar wafer ring ranging from 6-inch, 8-inch to 12-inches. It is also capable of inspecting both top and bottom of the wafer chip simultaneously for die surface inspection, probe mark inspection, wafer saw line inspection and final verification.

Trooper-V will be available in 2 different designs, one which is operate-able in cleanrooms (Class level 10) and the other which is operate-able in standard production floors depending on customer’s requirement.

With Trooper-V, it improves the overall inspection results accuracy and speed.

Feel free to contact us if you would like to know more on how Trooper-V can elevate your company to greater heights.