Latest µLED Display Module Final Test Solution which empowers display manufacturers to maximize efficiency and yield.

Latest µLED Display Module Final Test Solution which empowers display manufacturers to maximize efficiency and yield.

Penang, Malaysia (June, 2021) – Pentamaster, a One Stop Solution Provider for Smart Automation and Digitalization is proud to announce its latest µLED Display Module Final Test Solution. It is designed in response to the growing challenges of display development and production for µLED display modules.

The growth of µLED market is driven by the rise in demand for brighter display panels with higher pixel density and wider color spectrum. For instance, small-size displays for wearable products, middle-size display for automotive applications and extra-large TVs are the three major areas which are currently targeted by µLED display makers.

As an emerging technology in the early stages of maturity, µLED displays are expensive to make and pose a significant amount of challenges to be solved by display manufacturers. For example, it’s very challenging to inspect the uniformity and quality of these displays, since each individual diode is its own emitter and can exhibit wide variability in luminance and color. Hence, display manufacturers are in need of reliable and proven test system to measure and quantify µLED light and color output with high precision and accuracy.

Pentamaster’s µLED Display Module Final Test Solution is a comprehensive test solution designed for high-volume manufacturing of µLED display modules with test sequencing interface to perform multiple inspections simultaneously within a matter of seconds. It consists of a high-resolution imaging colorimeter with electronic lens for automated focusing on virtual images at variable distances and is capable of calculating image distances in real-distance units. Primary optical tests include evaluation of luminance, radiance, illuminance, irradiance, luminous intensity, radiant intensity and many other test parameters. Every test data obtained over the full field of view of the device under test (DUT) will be analyzed for image quality and performance.

With the new launch of µLED Display Module Final Test Solution, it greatly reduces manufacturing costs and human handling which improves the accuracy of the test results while maximizing production efficiency. Meanwhile, the users can customize their test inspection parameters to fit their future needs and maximize production throughput and yield.

If you are interested to know more, please feel free to contact us for more in-depth information.